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IEC 60748-11 : 1.0

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IEC 60748-11 : 1.0

SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 11: SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS

International Electrotechnical Committee

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Table of Contents

FOREWORD<br>PREFACE<br>Clause<br>1 Scope<br>2 General<br>&nbsp;&nbsp;&nbsp;2.1 Related documents<br>&nbsp;&nbsp;&nbsp;2.2 Recommended values of temperatures<br>&nbsp;&nbsp;&nbsp;2.3 Recommended values of voltages<br>&nbsp;&nbsp;&nbsp;2.4 Definitions related to manufacturing operations<br>3 Subcontracting<br>4 Primary stage of manufacture<br>&nbsp;&nbsp;&nbsp;4.1 Bipolar devices<br>&nbsp;&nbsp;&nbsp;4.2 Unipolar devices<br>5 Quality assessment procedures<br>&nbsp;&nbsp;&nbsp;5.1 Qualification approval procedures<br>&nbsp;&nbsp;&nbsp;5.2 Capability approval procedures<br>6 Structural similarity procedures<br>&nbsp;&nbsp;&nbsp;6.1 General rules<br>&nbsp;&nbsp;&nbsp;6.2 Test dependent criteria for structural similarity <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;- Table I<br>7 Groups and sub-groups<br>&nbsp;&nbsp;&nbsp;Table II - Group A: Lot by lot<br>&nbsp;&nbsp;&nbsp;Table III - Group B: Lot by lot<br>&nbsp;&nbsp;&nbsp;Table IV - Group C: Periodic tests<br>&nbsp;&nbsp;&nbsp;Table V - Group D<br>8 Screening<br>&nbsp;&nbsp;&nbsp;Table VI - Screening<br>9 Sampling requirements<br>&nbsp;&nbsp;&nbsp;Table VII - Sampling requirements for Group A tests<br>&nbsp;&nbsp;&nbsp;Table VIII - Sampling requirements for Group B, C<br>&nbsp;&nbsp;&nbsp;and D tests in which LTPD shall be used<br>10 Terminal identification<br>11 Additional information (under consideration)<br>12 Test and measurement procedures<br>&nbsp;&nbsp;&nbsp;12.1 Electrical measuring methods<br>&nbsp;&nbsp;&nbsp;12.2 Mechanical and climatic test methods<br>&nbsp;&nbsp;&nbsp;12.3 Electrical endurance tests<br>&nbsp;&nbsp;&nbsp;12.4 Accelerated test procedures<br>&nbsp;&nbsp;&nbsp;12.5 Correlated measurements<br>APPENDIX A - Guidance and format for drafting blank<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;detail specifications

Abstract

Pertains to encapsulated semiconductor integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits.

General Product Information

Document Type Standard
Status Current
Publisher International Electrotechnical Committee
Committee SC 47A
Supersedes
  • IEC 60148B : 1979