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IEEE 1671.6 : 2015

M00022093

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IEEE 1671.6 : 2015

AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST STATION DESCRIPTION

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Schema - TestStationDescription.xsd
5 Schema - TestStationInstance.xsd
6 ATML TestStationDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - User's information and
        examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography

Abstract

Specifies an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers