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IEEE 1671.5 : 2015

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IEEE 1671.5 : 2015

AUTOMATIC TEST MARKUP LANGUAGE (ATML) TEST ADAPTER DESCRIPTION

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - Users information and
        examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography

Abstract

Specifies an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers