M00022191
New product
ACCESS AND CONTROL OF INSTRUMENTATION EMBEDDED WITHIN A SEMICONDUCTOR DEVICE
Institute of Electrical & Electronics Engineers
In stock
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Availability date: 10/28/2021
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Technology
5 Hardware architecture
6 Instrument Connectivity Language (ICL)
7 Procedural Description Language (PDL): level-0
8 Procedural Description Language: level-1 (Tcl)
Annex A (informative) - ICL grammar
Annex B (informative) - PDL level-0 grammar
Annex C (informative) - PDL level-1 grammar
Annex D (informative) - PDL differences between
IEEE Std 1687-2014 and IEEE Std 1149.1-2013
Annex E (informative) - Examples
Annex F (informative) - Design guidance
Annex G (informative) - Bibliography
Defines a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1 test access port (TAP) and additional signals that may be required.
Published | |
Document Type | Standard |
Status | Current |
Publisher | Institute of Electrical & Electronics Engineers |
Pages | |
ISBN |