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IEEE 1687 : 2014

M00022191

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IEEE 1687 : 2014

ACCESS AND CONTROL OF INSTRUMENTATION EMBEDDED WITHIN A SEMICONDUCTOR DEVICE

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Technology
5 Hardware architecture
6 Instrument Connectivity Language (ICL)
7 Procedural Description Language (PDL): level-0
8 Procedural Description Language: level-1 (Tcl)
Annex A (informative) - ICL grammar
Annex B (informative) - PDL level-0 grammar
Annex C (informative) - PDL level-1 grammar
Annex D (informative) - PDL differences between
        IEEE Std 1687-2014 and IEEE Std 1149.1-2013
Annex E (informative) - Examples
Annex F (informative) - Design guidance
Annex G (informative) - Bibliography

Abstract

Defines a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1 test access port (TAP) and additional signals that may be required.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers