M00022444
New product
BOUNDARY-SCAN-BASED STIMULUS OF INTERCONNECTIONS TO PASSIVE AND/OR ACTIVE COMPONENTS
Institute of Electrical & Electronics Engineers
In stock
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Availability date: 10/29/2021
1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography
Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.
Published | |
Document Type | Standard |
Status | Current |
Publisher | Institute of Electrical & Electronics Engineers |
Pages | |
ISBN |