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IEEE C62.35 : 2010

M00022565

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IEEE C62.35 : 2010

STANDARD TEST METHODS FOR AVALANCHE JUNCTION SEMICONDUCTOR SURGE-PROTECTIVE DEVICE COMPONENTS

Institute of Electrical & Electronics Engineers

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Table of Contents

1. Scope
2. Definitions
3. V-I Characteristics for a unidirectional ABD
4. Circuit symbols
5. Service conditions
6. Standard design test procedures
7. Failures and fault modes
8. Derived parameters and other test procedures
Annex A (informative) - Bibliography

Abstract

Pertains to two terminal or multiple terminal silicon avalanche breakdown diodes (ABD), which are one type of surge protective device component (SPDC). Covers terms, symbols and definitions, and gives test methods for verifying ratings and measuring device characteristics.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers