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IEEE 1671 : 2010

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IEEE 1671 : 2010

AUTOMATIC TEST MARKUP LANGUAGE (ATML) FOR EXCHANGING AUTOMATIC TEST EQUIPMENT AND TEST INFORMATION VIA XML

Institute of Electrical & Electronics Engineers

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Table of Contents

1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Automatic test system (ATS) architecture
5. Automatic test markup language (ATML)
6. The ATML framework
7. ATML specification techniques
8. The ATML framework subdomains
9. ATML XML schema names and locations
10. ATML XML schema extensibility
11. Conformance
Annex A (normative) - XML schema style guidelines
Annex B (normative) - ATML common element schemas
Annex C (normative) - ATML internal model schemas
Annex D (normative) - ATML runtime services
Annex E (informative) - Pins, ports, connectors, and
        wire lists in ATML
Annex F (informative) - ATML capabilities
Annex G (informative) - IEEE download Web site material
        associated with this document
Annex H (informative) - ATS architectures
Annex I (informative) - Architecture examples
Annex J (informative) - UML models
Annex K (informative) - Glossary
Annex L (informative) - Bibliography

Abstract

Describes a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML).

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • IEEE DRAFT 1671 : D5 2006