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IEEE 1620 : 2008

M00022700

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IEEE 1620 : 2008

TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS

Institute of Electrical & Electronics Engineers

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Table of Contents

1. Overview
   1.1 Scope
   1.2 Purpose
   1.3 Electrical characterization overview
2. Definitions, acronyms, and abbreviations
   2.1 Definitions
   2.2 Acronyms and abbreviations
3. Standard OFET characterization procedures
   3.1 Device structures
   3.2 Guidelines for the OFET characterization process
   3.3 Electrical standards
   3.4 Reporting data
   3.5 Environmental control and standards
Annex A (informative) Bibliography

Abstract

Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers