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IEEE 1505.1 : 2008

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IEEE 1505.1 : 2008

COMMON TEST INTERFACE PIN MAP CONFIGURATION FOR HIGH-DENSITY, SINGLE-TIER ELECTRONICS TEST REQUIREMENTS UTILIZING IEEE STD 1505[TM]

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 Common test interface requirements
Annex A (normative) - Common test interface signal
        definitions for pin map
Annex B (informative) - Bibliography
Annex C (informative) - IEEE List of Participants

Abstract

Pertains to military and aerospace automatic test equipment (ATE) testing applications.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers