Table of Contents

FOREWORD
IEEE Introduction
1 Overview
    1.1 Scope
    1.2 Purpose
2 References
3 Definitions, acronyms, and abbreviations
    3.1 Definitions
    3.2 Acronyms and abbreviations
4 Structure of this standard
5 STIL orientation and capabilities tutorial
    (informative)
    5.1 Hello tester
    5.2 Basic LS245
    5.3 STIL timing expressions/"Spec" information
    5.4 Structural test (scan)
    5.5 Advanced scan
    5.6 IEEE Std 1149.1-1990 scan
    5.7 Multiple data elements per test cycle
    5.8 Pattern reuse/direct access test
    5.9 Event data/non-cyclized STIL information
6 STIL syntax description
    6.1 Case sensitivity
    6.2 Whitespace
    6.3 Reserved words
    6.4 Reserved characters
    6.5 Comments
    6.6 Token length
    6.7 Character strings
    6.8 User-defined name characteristics
    6.9 Domain names
    6.10 Signal and group name characteristics
    6.11 Timing name constructs
    6.12 Number characteristics
    6.13 Timing expressions and units (time_expr)
    6.14 Signal expressions (sigref_expr)
    6.15 WaveformChar characteristics
    6.16 STIL name spaces and name resolution
7 Statement structure and organization of STIL information
    7.1 Top-level statements and required ordering
    7.2 Optional top-level statements
    7.3 STIL files
8 STIL statement
    8.1 STIL syntax
    8.2 STIL example
9 Header block
    9.1 Header block syntax
    9.2 Header example
10 Include statement
    10.1 Include statement syntax
    10.2 Include example
    10.3 File path resolution with absolute path notation
    10.4 File path resolution with relative path notation
11 UserKeywords statement
    11.1 UserKeywords statement syntax
    11.2 UserKeywords example
12 UserFunctions statement
    12.1 UserFunctions statement syntax
    12.2 UserFunctions example
13 Ann statement
    13.1 Annotations statement syntax
    13.2 Annotations example
14 Signals block
    14.1 Signals block syntax
    14.2 Signals block example
15 SignalGroups block
    15.1 SignalGroups block syntax
    15.2 SignalGroups block example
    15.3 Default attribute values
    15.4 Translation of based data into WaveformChar
          characters
16 PatternExec block
    16.1 PatternExec block syntax
    16.2 PatternExec block example
17 PatternBurst block
    17.1 PatternBurst block syntax
    17.2 PatternBurst block example
18 Timing block and WaveformTable block
    18.1 Timing and WaveformTable syntax
    18.2 Waveform event definitions
    18.3 Timing and WaveformTable example
    18.4 Rules for timed event ordering and waveform
          creation
    18.5 Rules for waveform inheritance
19 Spec and Selector blocks
    19.1 Spec and Selector block syntax
    19.2 Spec and Selector block example
20 ScanStructures block
    20.1 ScanStructures block syntax
    20.2 ScanStructures block example
21 STIL Pattern data
    21.1 Cyclized data
    21.2 Multiple-bit cyclized data
    21.3 Non-cyclized data
    21.4 Scan data
    21.5 Pattern labels
22 STIL Pattern statements
    22.1 Vector (V) statement
    22.2 WaveformTable (W) statement
    22.3 Condition (C) statement
    22.4 Call statement
    22.5 Macro statement
    22.6 Loop statement
    22.7 MatchLoop statement
    22.8 Goto statement
    22.9 BreakPoint statements
    22.10 IDDQTestPoint statement
    22.11 Stop statement
    22.12 ScanChain statement
23 Pattern block
    23.1 Pattern block syntax
    23.2 Pattern initialization
    23.3 Pattern examples
24 Procedures and MacroDefs blocks
    24.1 Procedures block
    24.2 Procedures example
    24.3 MacroDefs block
    24.4 Scan testing
    24.5 Procedure and Macro Data substitution
Annex A (informative) Glossary
Annex B (informative) STIL data model
Annex C (informative) GNU GZIP reference
Annex D (informative) Binary STIL date format
Annex E (informative) LS245 design description
Annex F (informative) STIL FAQs and language design
                        decisions
Annex G (informative) List of participants

Abstract

Specifies a test description language that: a) Defines format, pattern and timing information sufficient to define the application of digital test vectors to a device under test (DUT); b) Aids the transfer of large quantities of digital test vector data from CAE environments to automated test equipment (ATE) environments; c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test methods such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN
Supersedes	IEEE DRAFT 1450 : D0.95 98