Table of Contents

1 Overview
2 Normative references
3 Definitions
4 Test parameters and methods
5 Input impedance
6 Static gain and offset
7 Linearity
8 Noise
9 Step response parameters
10 Frequency response parameters
11 Interchannel parameters
12 Time base parameters
13 Out-of-range recovery
14 Word error rate
15 Differential input specifications
16 Cycle time
17 Triggering
Annex A (informative) - Sine fitting algorithms
Annex B (informative) - Phase noise
Annex C (informative) - Comment on errors associated with
        word-error-rate measurement
Annex D (informative) - Measurement of randaom noise below
        the quantization level
Annex E (informative) - Software consideration
Annex F (informative) - Excitation with precision source with ramp
        verneir: determination of the test parameters
Annex G (informative) - Presentation of sine wave data
Annex H (informative) - Bibliography

Abstract

Delineates specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with digital outputs.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	Institute of Electrical & Electronics Engineers
Pages
ISBN
Supersedes	IEEE DRAFT 1057 : OCT 93