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IEEE 1368 : 2006

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IEEE 1368 : 2006

AEOLIAN VIBRATION FIELD MEASUREMENTS OF OVERHEAD CONDUCTORS

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
  1.1 Scope
  1.2 Purpose
  1.3 Conductor fatigue damage
  1.4 Damping systems
  1.5 When field measurement is indicated
2 Background
  2.1 Bending amplitude as primary measured parameter
  2.2 Location for measuring bending amplitude
  2.3 Assessing the risk of fatigue through measurements of
      bending amplitude
  2.4 Possible sources of measurement inaccuracies
  2.5 Effect of recorder mass
  2.6 Other measurement techniques
3 General test arrangements
  3.1 Measurement location
  3.2 Scheduling and duration of tests
  3.3 Recording instruments
  3.4 Measured data
  3.5 Data sampling and reporting
  3.6 Choosing scales on the vibration recorder
  3.7 Documenting test conditions
  3.8 Access to data
4 Interpretation of field vibration measurements
  4.1 Introduction to interpretation of field vibration measurements
  4.2 Inspection program
  4.3 Inspection based on measured vibration levels
  4.4 Cumulative damage considerations
  4.5 Criteria for bending amplitude limits
5 Summary of common problems with field recording
  5.1 User objective
  5.2 Practical considerations
  5.3 Design, manufacture, and quality control of recorders
  5.4 Installation of recorders
  5.5 Calibration of recorders
  5.6 Field performance
  5.7 Primary factors to consider when selecting a vibration recorder
6. Conclusions and summary
Annex A (informative) Vibration study data sheet
Annex B (informative) Typical amplitude versus frequency
        recorder report
Annex C (informative) Estimated bending amplitude endurance
        limits for ACSR
Annex D (informative) Estimated bending amplitude endurance
        limits for various types of conductors
Annex E (informative) Bibliography

Abstract

Presents current practices related to field measurements of aeolian vibration of overhead conductors.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • IEEE DRAFT 1368 : D23.5 2006