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IEEE 1450.6 : 2005

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IEEE 1450.6 : 2005

STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA - CORE TEST LANGUAGE (CTL)

Institute of Electrical & Electronics Engineers

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Table of Contents

1 Overview
   1.1 General
   1.2 SoC flow
   1.3 Scope
   1.4 Purpose
   1.5 Limitations of this standard
   1.6 Structure of this standard
2 Normative references
3 Definitions, acronyms, and abbreviations
   3.1 Definitions
   3.2 Acronyms and abbreviations
4 CTL orientation and capabilities tutorial
   4.1 Introduction
   4.2 CTL for design configurations
   4.3 CTL for structural information
   4.4 CTL for test pattern information
   4.5 Beyond the examples
5 Extensions to IEEE Std 1450-1999 and IEEE Std 1450.1-2005
   5.1 STIL name spaces and name resolution
   5.2 Optional statements of IEEE Std 1450-1999
   5.3 Restricting the usage of SignalGroup and variable names
   5.4 Additional reserved words
   5.5 STIL statement - extensions to IEEE Std 1450-1999, Clause 8
   5.6 Extensions to IEEE Std 1450-1999, 17.1 and 23.1
   5.7 Extensions associated with the LockStep construct
        of Clause 13 of IEEE Std 1450.1-2005
6 Design hierarchy - cores
   6.1 CoreType block and CoreInstance statement
   6.2 CoreType block syntax descriptions
   6.3 CoreType block code example
7 Cell expression (cellref_expr)
8 Environment block - extensions to IEEE Std 1450.1-2005, Clause 17
   8.1 General
   8.2 Definition of FileReference keywords
   8.3 Example of Environment block FileReference syntax
   8.4 Extension to NameMaps
   8.5 Extension to the inheritance of environment statements
9 CTLMode block
   9.1 General
   9.2 CTLMode syntax
   9.3 CTLMode block - syntax descriptions
   9.4 CTLMode block syntax example
10 CTLMode - Internal block
   10.1 General
   10.2 Internal syntax
   10.3 Internal block syntax descriptions
   10.4 Internal BlockSyntax examples
11 CTLMode - ScanInternal block
   11.1 General
   11.2 ScanInternal syntax
   11.3 ScanInternal block syntax descriptions
   11.4 ScanInternal block syntax example
12 CTLMode - CoreInternal block
   12.1 General
   12.2 CoreInternal syntax
   12.3 CoreInternal block syntax descriptions
   12.4 CoreInternal block syntax examples
13 CTLMode - Relation Block
   13.1 General
   13.2 Relation syntax
   13.3 Relation block syntax descriptions
   13.4 Relation block syntax example
14 CTLMode - ScanRelation block
   14.1 General
   14.2 ScanRelation syntax
   14.3 ScanRelation block syntax descriptions
15 CTLMode - External block
   15.1 General
   15.2 External statement syntax
   15.3 External block syntax descriptions
   15.4 External block syntax example
16 CTLMode - PatternInformation block
   16.1 PatternInformation syntax
   16.2 PatternInformation block syntax descriptions
   16.3 PatternInformation block syntax example
Index

Abstract

Describes constructs that represent the test structures internal to the core for reuse in the creation of the tests for the logic outside the core. This provides constructs that will allow for the wrapping operation of an unwrapped core and the necessary wrapper specific information for a wrapped core.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • IEEE DRAFT 1450.6 : D1.6 2005