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IEEE 1445 : 1998

M00023033

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IEEE 1445 : 1998

DIGITAL TEST INTERCHANGE FORMAT (DTIF)

Institute of Electrical & Electronics Engineers

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Table of Contents

1. Overview
2. Normative references
3. Definitions, acronyms and abbreviations
4. Data organization overview of the DTIF
   standard environment
5. File type specifications
6. Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - Example of a circuit used in
        a test simulation
Annex C (informative) - Bibliography

Abstract

Specifies DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing.

General Product Information

Document Type Standard
Status Current
Publisher Institute of Electrical & Electronics Engineers
Supersedes
  • IEEE DRAFT 1445 : JUL 98