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ISO 22493 : 2014

M00023173

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ISO 22493 : 2014

MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - VOCABULARY

International Organization for Standardization

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Table of Contents

Foreword
Introduction
1 Scope
2 Abbreviated terms
3 Terms and definitions used in the physical
  basis of SEM
4 Terms and definitions used in SEM instrumentation
5 Terms and definitions used in SEM image
  formation and processing
6 Terms and definitions used in SEM image
  interpretation and analysis
7 Terms and definitions used in the measurement
  and calibration of SEM image
  magnification and resolution
Bibliography

Abstract

Describes terms used in the practice of scanning electron microscopy (SEM).

General Product Information

Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 202
Supersedes
  • ISO/DIS 22493 : 60.00 (2014)