M00023173
New product
MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - VOCABULARY
International Organization for Standardization
In stock
Warning: Last items in stock!
Availability date: 11/05/2021
Foreword
Introduction
1 Scope
2 Abbreviated terms
3 Terms and definitions used in the physical
basis of SEM
4 Terms and definitions used in SEM instrumentation
5 Terms and definitions used in SEM image
formation and processing
6 Terms and definitions used in SEM image
interpretation and analysis
7 Terms and definitions used in the measurement
and calibration of SEM image
magnification and resolution
Bibliography
Describes terms used in the practice of scanning electron microscopy (SEM).
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 202 |
Supersedes |
|