M00023298
New product
SILK - ELECTRONIC TEST METHOD FOR DEFECTS AND EVENNESS OF RAW SILK
International Organization for Standardization
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Availability date: 11/05/2021
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Apparatus
6 Atmospheres for conditioning and testing
7 Lot formation and sampling
8 Laboratory sample preparation
9 Setting
10 Test procedure
11 Calculation and expression of test results
12 Precision
13 Test report
Annex A (normative) - Defect counting and classification
Annex B (informative) - Difference between the optical and
capacitive sensors in detecting defects of raw silk
Annex C (normative) - Method for preparing soaked raw silk
in lab
Annex D (informative) - An example of the electronic testing
result sheet
Annex E (informative) - Testing precision
Bibliography
Describes a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 38 |
Supersedes |
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