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ISO 15625 : 2014

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ISO 15625 : 2014

SILK - ELECTRONIC TEST METHOD FOR DEFECTS AND EVENNESS OF RAW SILK

International Organization for Standardization

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Table of Contents

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Apparatus
6 Atmospheres for conditioning and testing
7 Lot formation and sampling
8 Laboratory sample preparation
9 Setting
10 Test procedure
11 Calculation and expression of test results
12 Precision
13 Test report
Annex A (normative) - Defect counting and classification
Annex B (informative) - Difference between the optical and
        capacitive sensors in detecting defects of raw silk
Annex C (normative) - Method for preparing soaked raw silk
        in lab
Annex D (informative) - An example of the electronic testing
        result sheet
Annex E (informative) - Testing precision
Bibliography

Abstract

Describes a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

General Product Information

Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 38
Supersedes
  • ISO/DIS 15625 : 60.00 (2014)