Table of Contents

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Optical sensing using semiconductor lasers
5 Measurement method for temperature dependence of
  wavelength
6 Measurement method for current dependence of wavelength
7 Measurement method of spectral line width
Annex A (informative) - Essential ratings and characteristics
Bibliography

Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Organization for Standardization
Pages
ISBN
Committee	TC 172
Supersedes	ISO TS 17915 : 2013