M00023691
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SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - CORRECTION METHOD FOR SATURATED INTENSITY IN SINGLE ION COUNTING DYNAMIC SECONDARY ION MASS SPECTROMETRY
International Organization for Standardization
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Availability date: 11/05/2021
Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Symbols and abbreviated terms<br>5 Outline of method<br>6 Procedure for evaluating intensity linearity<br>7 Reporting the results<br>8 Correcting saturated intensity to the measurement<br> results of the analysis samples<br>Annex A (informative) - Effect of the dead time correction<br> with various instruments for VAMAS study<br>Bibliography
Provides a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in pulse counting magnetic sector-type secondary ion mass spectrometers or quadrupole secondary ion mass spectrometers.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 201 |