Table of Contents

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Reference materials
6 Equipment
7 Specimens
8 Experimental procedure
9 Measurement and solution of the
   SAED patterns
10 180 degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing
Annex B (informative) - Spot diffraction patterns
        of single crystals for BCC, FCC and HCP structure[7]
Bibliography

Abstract

Describes the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Organization for Standardization
Pages
ISBN
Committee	TC 202