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ISO 15932 : 2013

M00027157

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ISO 15932 : 2013

MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY

International Organization for Standardization

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Table of Contents

Foreword
Introduction
0 Scope
1 Abbreviated terms
2 Definitions of terms used in the physical basis
  of AEM
3 Definitions of terms used in AEM instrumentation
4 Definitions of terms used in specimen preparation
  of AEM
5 Definitions of terms used in AEM image formation
  and processing
6 Definitions of terms used in AEM image
  interpretation and analysis
7 Definitions of terms used in the measurement and
  calibration of AEM image magnification
  and resolution
8 Definitions of terms used in electron diffraction
  in AEM
Bibliography

Abstract

Specifies terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order.

General Product Information

Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 202
Supersedes
  • ISO/DIS 15932 : 60.00 (2013)