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ISO 17862 : 2013

M00027383

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ISO 17862 : 2013

SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - LINEARITY OF INTENSITY SCALE IN SINGLE ION COUNTING TIME-OF-FLIGHT MASS ANALYSERS

International Organization for Standardization

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Table of Contents

Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Procedure for evaluating the intensity linearity
5 Interval for repeat measurements
Annex A (normative) - Computation of raster size,
        ion beam current, number of frames for
        analysis, and counts per pulse
Annex B (normative) - Charge compensation setting
Annex C (normative) - Ion detector setting
Annex D (informative) - Instrumental factors
        affecting linearity
Bibliography

Abstract

Defines a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE).

General Product Information

Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 201
Supersedes
  • ISO/DIS 17862 : 40.99 (2013)