M00027705
New product
SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - MEASUREMENT OF DRIFT RATE
International Organization for Standardization
In stock
Warning: Last items in stock!
Availability date: 11/05/2021
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions and abbreviated terms
4 Measurement method
5 Requirements
6 Measurement procedures
7 Measurement report
Annex A (normative) - Image correlation method
Annex B (normative) - Characteristic-marker method
Annex C (normative) - Non-periodic grating method
Annex D (informative) - Guidance to users
Annex E (informative) - Instrumental parameters to
consider to reduce drift rates
Annex F (informative) - Example of drift results
and analysis
Bibliography
Describes terms and specifies measurement methods for characterizing the drift rates of scanning-probe microscopy (SPM) instruments in the X- and Y-directions and, for SPM instruments measuring topography, the drift rate in the Z-direction.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 201 |
Supersedes |
|