Table of Contents

Foreword <br>1 Scope<br>2 Normative references <br>3 Terms and definitions <br>4 Principle <br>5 Reagents<br>6 Apparatus<br>7 Sample<br>8 Procedure<br>9 Calculation<br>10 Reporting results <br>11 Precision<br>12 Test report <br>Annex A (normative) - Acceptance of analytical results <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;for laboratory method<br>Annex B (informative) - Reagents suitable for the <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;preparation of synthetic calibration standards<br>Annex C (normative) - Standard deviation of glass <br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;disc preparation<br>Bibliography

Abstract

This Technical Specification sets out a wavelength dispersive X-ray fluorescence (XRF) procedure for the determination of silicon, aluminium, iron, calcium, magnesium, sodium, potassium, titanium, manganese, phosphorus and sulfur.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Organization for Standardization
Pages
ISBN
Committee	TC 27
Superseded By	ISO 13605 : 2018