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ISO TS 10798 : 2011

M00028082

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ISO TS 10798 : 2011

NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS

International Organization for Standardization

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Table of Contents

Foreword<br>Introduction<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 General principles<br>5 Sample preparation methods<br>6 Measurement procedures<br>7 Data analysis and results interpretation<br>8 Measurement uncertainty<br>Annex A (normative) - SEM sampling methods<br>Annex B (informative) - Supportive information on EDX<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;characterization of CNT materials<br>Annex C (informative) - Case study for the analysis of<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;as-synthesized and purified SWCNT samples<br>Annex D (informative) - Examples of SEM/EDX analysis of SWCNTs<br>Bibliography

Abstract

Specifies methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

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Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 229