Table of Contents

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 General information
6 Measurement of lateral resolution by imaging a very small
  object
Annex A (informative) - Examples using a line-profile and a
        CdSe/ZnS quantum dot as specimen
Annex B (informative) - Example of a procedure for preparing
        standard NSOM specimens
Bibliography

Abstract

Specifies a method for determining the spatial (lateral) resolution of an apertured near-field scanning optical microscope (NSOM) by imaging an object with a size much smaller than the expected resolution.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Organization for Standardization
Pages
ISBN
Committee	TC 201
Supersedes	ISO/DIS 27911 : 60.00 (2011)