Table of Contents

Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 General items applicable to the test methods
5 Test methods for electrical characteristics of cards
  with contacts
6 Test methods for logical operations of cards with
  contacts
7 Test methods for physical and electrical characteristics
  of the IFD
8 Test methods for logical operations of the IFD

Abstract

Specifies test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816.

General Product Information

Published
Document Type	Standard
Status	Current
Publisher	International Organization for Standardization
Pages
ISBN
Committee	JTC 1