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ISO 24173 : 2009

M00029015

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ISO 24173 : 2009

MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION

International Organization for Standardization

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Table of Contents

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment for EBSD
5 Operating conditions
6 Calibrations required for indexing of EBSPs
7 Analytical procedure
8 Measurement uncertainty
9 Reporting the results
Annex A (informative) - Principle of EBSD
Annex B (normative) - Specimen preparation for EBSD
Annex C (informative) - Brief introduction to crystallography
        and EBSP indexing, and other information useful for
        EBSD
Bibliography

Abstract

Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).

General Product Information

Document Type Standard
Status Current
Publisher International Organization for Standardization
Committee TC 202
Supersedes
  • ISO/DIS 24173 : 60.00 (2009)