M00029015
New product
MICROBEAM ANALYSIS - GUIDELINES FOR ORIENTATION MEASUREMENT USING ELECTRON BACKSCATTER DIFFRACTION
International Organization for Standardization
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Availability date: 11/05/2021
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment for EBSD
5 Operating conditions
6 Calibrations required for indexing of EBSPs
7 Analytical procedure
8 Measurement uncertainty
9 Reporting the results
Annex A (informative) - Principle of EBSD
Annex B (normative) - Specimen preparation for EBSD
Annex C (informative) - Brief introduction to crystallography
and EBSP indexing, and other information useful for
EBSD
Bibliography
Provides advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD).
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 202 |
Supersedes |
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