M00029551
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SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - GUIDE TO THE USE OF EXPERIMENTALLY DETERMINED RELATIVE SENSITIVITY FACTORS FOR THE QUANTITATIVE ANALYSIS OF HOMOGENEOUS MATERIALS
International Organization for Standardization
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Availability date: 11/05/2021
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 General information
6 Measurement conditions
7 Data-analysis procedures
8 Intensity-energy response function
9 Determination of chemical composition using
relative sensitivity factors
Annex A (normative) - Formulae for relative sensitivity factors
Annex B (informative) - Information on uncertainty of the
analytical results
Bibliography
Provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Published | |
Document Type | Standard |
Status | Current |
Publisher | International Organization for Standardization |
Pages | |
ISBN | |
Committee | TC 201 |
Supersedes |
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