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JIS R 1637:1998
M00064375
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JIS R 1637:1998
Test method for resistivity of conductive fine ceramic thin films with a four-point probe array
Japanese Standards Association
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Table of Contents
Abstract
This Japanese Industrial Standard specifies the test method for resistivity of the conductive fine ceramic thin films with a four-point array. The applicable range of the resistivity shall be 1*10-5 ohm cm, and film thickness shall be maximum 500 mum.
General Product Information
| Document Type | Standard |
| Status | Current |
| Publisher | Japanese Standards Association |