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JIS K 0131:1996

M00064875

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JIS K 0131:1996

General rules for X-ray diffractometric analysis

Japanese Standards Association

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Abstract

This Japanese Industrial Standard specifies the general rules for the measurements of diffracted X-ray using a X-ray diffractometer in order to make the identification and determination, the accurate measurement of lattice constant, and the measurement of crystallinity degree, of substances.

General Product Information

Document Type Standard
Status Current
Publisher Japanese Standards Association