M00014674
New product
MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)
SAE International
In stock
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Availability date: 10/28/2021
1 Scope
2 References
3 Definitions
4 Test Conditions
5 Test equipment
6 Test set-up
7 Test procedure
8 Data presentation
9 IC Emissions reference levels
10 Notes
Appendix A - Example calibration and set up verification sheet
Appendix B - 1 GHz tem cell and wideband tem cell
Appendix C - Calculation of dipole moment from measured data
Appendix D - Specification of emission levels
Describes a method for measuring the electromagnetic radiation from an integrated circuit (IC).
Published | |
Document Type | Standard |
Status | Current |
Publisher | SAE International |
Pages | |
ISBN |